Inspired by the capability of structured illumination microscopy (SIM) in subwavelength imaging, many researchers devoted themselves to investigating this methodology. However, due to the free-propagating feature of the traditional structured illumination fields, the resolution can be only improved up to two-fold of the diffraction-limited microscopy. Besides, most of the previous studies, relying on incoherent illumination sources, are restricted to fluorescent samples. In this work, a subwavelength non-fluorescent imaging method is proposed based on the illumination of terahertz traveling waves and plasmonics. Excited along with a metal grating, the spoof surface plasmons (SSPs) are employed as one of the illuminating sources. When the scattering waves with the SSPs illumination are captured, the sample's high-order spatial frequencies (SF) components are already encoded into the obtainable low-order ones. Then, a modified post-processing algorithm is exploited to shift the modulated SF components to their actual positions in the SF domain. In this manner, the fine information of samples is introduced to reconstruct the desired imaging, leading to an enhancement of the resolution up to 0.12λ0. Encouragingly, the resolution can be further enhanced by attaching extra illumination of SSPs with an elaborately selected frequency. This method holds promise for some important applications in terahertz non-fluorescent microscopy and sample detection with weak scattering.