Spectroscopic techniques are commonly used for the non-invasive characterization of the molecular and elemental composition of greenstone archaeological artifacts. The surface topography of these artifacts is greatly influenced by the crafting and polishing techniques employed in their making. However, no study of the effect of roughness on spectra has ever been reported for greenstones. Here we show that infrared, Raman and X-ray fluorescence spectra are strongly influenced by the sample's surface roughness. Spectral changes were seen in both geological (45 jadeite and green stone samples) and archaeological artifacts (12 axe-God pendants); in every case, the variations were more prominent in samples with higher arithmetic average height values. The results show that these changes can affect the interpretation of the spectroscopic data and limit the efficacy of statistical analysis. Consequently, any spectroscopic characterization of this type of samples should be performed preferably in areas with lower values of roughness parameters. Overall, FT-IR appears to be the most advantageous technique to distinguish the differences in mineral composition of this type of samples during in situ studies; its performance was evaluated with an innovative statistical analysis that treats the spectra as functional data. Additionally, the results suggest that confocal Raman spectroscopy is an ideal complementary technique that enhances mineralogical characterization, nevertheless its applicability is limited to laboratory settings.
Keywords: FT-IR; Functional data analysis; Non-invasive characterization; Profilometry; Raman Spectroscopy; XRF.
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