Reflection terahertz time-domain spectroscopy for imaging and identifying concealed interfaces in insulated systems

Appl Opt. 2021 Aug 10;60(23):6818-6828. doi: 10.1364/AO.429888.

Abstract

Polarization-resolved reflection spectroscopy enabled by a custom ultrahigh molecular weight polymer dove prism is used to identify spectral characteristics that manifest in the time domain at terahertz frequencies, which shows promise in combination with terahertz time-domain reference-free reflection imaging at a concealed interface. The method is used to produce 100×100 pixel images of an interface concealed by an ultrahigh molecular weight polymer using TE and TM polarized terahertz fields. The construction of material-specific image filters is guided by a theoretical reflection model by identifying reflection pulse characteristics unique to an interface. Application of these filters to the collected terahertz images distinguishes materials at the interface including the concealing plastic, water, air, glass, and metal that are correctly identified and imaged.