Erratum: "Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy" [Rev. Sci. Instrum. 92, 023703 (2021)]
Rev Sci Instrum
.
2021 Apr 1;92(4):049901.
doi: 10.1063/5.0052231.
Authors
Khaled Kaja
1
,
Denis Mariolle
2
,
Nicolas Chevalier
2
,
Adnan Naja
3
,
Mustapha Jouiad
4
Affiliations
1
Laboratoire National de Métrologie et d'Essais, 29 Rue Roger Hennequin, 78190 Trappes, France.
2
University Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France.
3
Laboratory of Physics and Modelling, EDST, Lebanese University, 1300 Tripoli, Lebanon.
4
Laboratory of Physics of Condensed Matter, LPMC, Université de Picardie Jules Verne, 80093 Amiens, France.
PMID:
34243477
DOI:
10.1063/5.0052231
No abstract available
Publication types
Published Erratum