Many polymorphic crystal structures of copper phthalocyanine (CuPc) have been reported over the past few decades, but despite its manifold applicability, the structure of the frequently mentioned α polymorph remained unclear. The base-centered unit cell (space group C2/c) suggested in 1966 was ruled out in 2003 and was replaced by a primitive triclinic unit cell (space group P 1). This study proves unequivocally that both α structures coexist in vacuum-deposited CuPc thin films on native silicon oxide by reciprocal space mapping using synchrotron radiation in grazing incidence. The unit-cell parameters and the space group were determined by kinematic scattering theory and provide possible molecular arrangements within the unit cell of the C2/c structure by excluded-volume considerations. In situ X-ray diffraction experiments and ex situ atomic force microscopy complement the experimental data further and provide insight into the formation of a smooth thin film by a temperature-driven downward diffusion of CuPc molecules during growth.
Keywords: GenX; X-ray reflectivity; atomic force microscopy; grazing-incidence X-ray diffraction; morphology; organic semiconductors; polymorphism; reciprocal space mapping; thin films.
© Berthold Reisz et al. 2021.