We investigate first- and second-order spatial differentiation of an optical beam transverse profile using guided-mode resonances in thin, suspended subwavelength gratings. Highly reflective one-dimensional gratings are patterned on freestanding 200 nm-thick silicon nitride membranes using Electron Beam Lithography and plasma etching. The optical transmission of these gratings, designed for illumination with either TM or TE polarized light, are experimentally measured under normal and oblique incidence and found to be in excellent agreement with the predictions of an analytical coupled-mode model as well as Rigorous Coupled Wave Analysis numerical simulations. Intensity profiles consistent with high quality first- and second-order spatial differentiation of a Gaussian beam are observed in transmission at oblique and normal incidence, respectively. Such easy-to-fabricate, ultrathin and loss-free optical components may be attractive for beam shaping and optical information processing and computing.