Phase competition in transition metal oxides has attracted remarkable interest for fundamental aspects and technological applications. Here, we report a concurrent study of the phase transitions in undoped and Cr-doped VO[Formula: see text] thin films. The structural, morphological and electrical properties of our films are examined and the microstructural effect on the metal-insulator transition (MIT) are highlighted. We further present a distinctive approach for analyzing the Raman data of undoped and Cr-doped VO[Formula: see text] thin films as a function of temperature, which are quantitatively correlated to the electrical measurements of VO[Formula: see text] films to give an insight into the coupling between the structural phase transition (SPT) and the MIT. These data are also combined with reported EXAFS measurements and a connection between the Raman intensities and the mean Debye-Waller factors [Formula: see text] is established. We found that the temperature dependence of the [Formula: see text] as calculated from the Raman intensity retraces the temperature profile of the [Formula: see text] as obtained from the EXAFS data analysis. Our findings provide an evidence on the critical role of the thermal vibrational disorder in the VO[Formula: see text] phase transitions. Our study demonstrates that correlating Raman data with EXAFS analysis, the lattice and electronic structural dynamics can be probed.