The microstructural origin of the double yield points of metallocene linear low-density polyethylene (mLLDPE) precursor films has been studied with the assistance of the synchrotron radiation small- and wide-angle X-ray scattering (SAXS/WAXS). It has been shown that the microstructural origin of the double yield points is highly related to the initial orientation of the original precursor film. For less oriented mLLDPE precursor films, the rearrangement of lamellae and the appearance of the monoclinic phase are the microstructural origins of the first yield point. In comparison, for the highly-oriented mLLDPE precursor film, only the orthorhombic-monoclinic phase transition appears at the first yield point. The melting-recrystallization and the formation of the fibrillary structure happen beyond the second yield point for all studied mLLDPE precursor films. Finally, the detailed microstructural evolution roadmaps of mLLDPE precursor films under uniaxial tensile deformation have been established, which might serve as a guide for processing high-performance polymer films by post-stretching.
Keywords: double yield points; in situ SAXS/WAXS; mLLDPE.