We propose a dual shearing shearography system based on a spatial light modulator (SLM). Compared to spatial phase shift shearography, the advantages of this system include its simple structure, relatively high light efficiency, and good phase map quality. Digital shearography is a fast, practical, non-contact, whole-field, and anti-turbulent optical approach to non-destructive testing (NDT) and strain measurement. Because the shearing direction determines the strain direction being measured, tests using multiple shearing directions are sometimes required to obtain strain in different directions and detect all defects. Various setups, based on the spatial phase shift method, have been proposed to solve the issue. While some of these setups perform well, they may also introduce new problems, such as poor phase map quality and low light efficiency. We present a sequential dual shearing shearographic system with good phase map quality and high light efficiency. Due to the SLM's high-speed response, capable of reaching hundreds of hertz, SLM-based dual shearing direction shearography allows for fast temporal phase shifting and shearing direction switching while providing very good phase map quality. Unlike the spatial phase shift method, which has low light efficiency due to its need for a small aperture to enable a relatively large speckle size to cover multiple pixels, the proposed method is based on a fast temporal phase shift and does not have this limitation. In addition, SLM can provide a programmable and adjustable shearing method in any direction and distance, which is beneficial for strain measurements and NDT requiring strain measurements in different directions using a small and precise shearing distance. We describe in detail the theory derivation and non-destructive testing application results for the SLM-based dual shearing direction shearography system.