Extrinsic Photoconduction Induced Short-Wavelength Infrared Photodetectors Based on Ge-Based Chalcogenides

Ting He; Zhen Wang; Ruyue Cao; Qing Li; Meng Peng; Runzhang Xie; Yan Huang; Yang Wang; Jiafu Ye; Peisong Wu; Fang Zhong; Tengfei Xu; Hailu Wang; Zhuangzhuang Cui; Qinghua Zhang; Lin Gu; Hui-Xiong Deng; He Zhu; Chongxin Shan; Zhongming Wei; Weida Hu

doi:10.1002/smll.202006765

Extrinsic Photoconduction Induced Short-Wavelength Infrared Photodetectors Based on Ge-Based Chalcogenides

Small. 2021 Jan;17(4):e2006765. doi: 10.1002/smll.202006765. Epub 2020 Dec 20.

Authors

Ting He^{1

2}, Zhen Wang^{1

2}, Ruyue Cao^{2

3}, Qing Li^{1

4}, Meng Peng¹, Runzhang Xie^{1

2}, Yan Huang¹, Yang Wang^{1

5}, Jiafu Ye^{1

2}, Peisong Wu^{1

2}, Fang Zhong¹, Tengfei Xu¹, Hailu Wang^{1

2}, Zhuangzhuang Cui^{1

2}, Qinghua Zhang⁶, Lin Gu⁶, Hui-Xiong Deng³, He Zhu⁴, Chongxin Shan⁷, Zhongming Wei³, Weida Hu^{1

2

4}

Affiliations

¹ State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China.
² School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.
³ State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.
⁴ Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, 310024, China.
⁵ State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China.
⁶ Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, China.
⁷ Henan Key Laboratory of Diamond Optoelectronic Materials and Devices, School of Physics and Engineering, Zhengzhou University, Zhengzhou, 450001, China.

PMID: 33345467
DOI: 10.1002/smll.202006765

Abstract

2D layered photodetectors have been widely researched for intriguing optoelectronic properties but their application fields are limited by the bandgap. Extending the detection waveband can significantly enrich functionalities and applications of photodetectors. For example, after breaking through bandgap limitation, extrinsic Si photodetectors are used for short-wavelength infrared or even long-wavelength infrared detection. Utilizing extrinsic photoconduction to extend the detection waveband of 2D layered photodetectors is attractive and desirable. However, extrinsic photoconduction has yet not been observed in 2D layered materials. Here, extrinsic photoconduction-induced short-wavelength infrared photodetectors based on Ge-based chalcogenides are reported for the first time and the effectiveness of intrinsic point defects are demonstrated. The detection waveband of room-temperature extrinsic GeSe photodetectors with the assistance of Ge vacancies is broadened to 1.6 µm. Extrinsic GeSe photodetectors have an excellent external quantum efficiency (0.5%) at the communication band of 1.31 µm and polarization-resolved capability to subwaveband radiation. Moreover, room-temperature extrinsic GeS photodetectors with a detection waveband to the communication band of 1.55 µm further verify the versatility of intrinsic point defects. This approach provides design strategies to enrich the functionalities of 2D layered photodetectors.

Keywords: Ge-based chalcogenides; defect engineering; extrinsic photoconduction effect; infrared photodetectors.

Abstract

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