Metasurface enabled quantum edge detection

Junxiao Zhou; Shikai Liu; Haoliang Qian; Yinhai Li; Hailu Luo; Shuangchun Wen; Zhiyuan Zhou; Guangcan Guo; Baosen Shi; Zhaowei Liu

doi:10.1126/sciadv.abc4385

Metasurface enabled quantum edge detection

Sci Adv. 2020 Dec 16;6(51):eabc4385. doi: 10.1126/sciadv.abc4385. Print 2020 Dec.

Authors

Junxiao Zhou^{1

2}, Shikai Liu³, Haoliang Qian^{2

4}, Yinhai Li³, Hailu Luo⁵, Shuangchun Wen¹, Zhiyuan Zhou⁶, Guangcan Guo³, Baosen Shi³, Zhaowei Liu⁷

Affiliations

¹ Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, China.
² Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Drive, La Jolla, CA 92093, USA.
³ Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei, Anhui 230026, China and Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China.
⁴ Interdisciplinary Center for Quantum Information, State Key Laboratory of Modern Optical Instrumentation, ZJU-Hangzhou Global Science and Technology Innovation Center, Zhejiang University, Hangzhou 310027, China.
⁵ Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, China. zyzhouphy@ustc.edu.cn hailuluo@hnu.edu.cn zhaowei@ucsd.edu.
⁶ Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei, Anhui 230026, China and Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China. zyzhouphy@ustc.edu.cn hailuluo@hnu.edu.cn zhaowei@ucsd.edu.
⁷ Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Drive, La Jolla, CA 92093, USA. zyzhouphy@ustc.edu.cn hailuluo@hnu.edu.cn zhaowei@ucsd.edu.

Abstract

Metasurfaces consisting of engineered dielectric or metallic structures provide unique solutions to realize exotic phenomena including negative refraction, achromatic focusing, electromagnetic cloaking, and so on. The intersection of metasurface and quantum optics may lead to new opportunities but is much less explored. Here, we propose and experimentally demonstrate that a polarization-entangled photon source can be used to switch ON or OFF the optical edge detection mode in an imaging system based on a high-efficiency dielectric metasurface. This experiment enriches both fields of metasurface and quantum optics, representing a promising direction toward quantum edge detection and image processing with remarkable signal-to-noise ratio.

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