Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Mario Lanza; Quentin Smets; Cedric Huyghebaert; Lain-Jong Li

doi:10.1038/s41467-020-19053-9

Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Nat Commun. 2020 Nov 10;11(1):5689. doi: 10.1038/s41467-020-19053-9.

Authors

Mario Lanza¹, Quentin Smets², Cedric Huyghebaert², Lain-Jong Li^{3

4}

Affiliations

¹ Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia. mario.lanza@kaust.edu.sa.
² IMEC, Kapeldreef 75, 3001, Heverlee (Leuven), Belgium.
³ Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia.
⁴ Department of Electronic Engineering, and Green Technology Research Center, Chang-Gung University, Taoyuan, 333, Taiwan.

Abstract

The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.