Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography

J Appl Crystallogr. 2020 Jul 8;53(Pt 4):949-956. doi: 10.1107/S1600576720006913. eCollection 2020 Aug 1.

Abstract

The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resolution complex-valued wavefunctions of individual pulses without strong constraints on the illumination or sample object used. The technique is demonstrated within experimental conditions suited for diffraction experiments and exploiting Kirkpatrick-Baez focusing optics. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution.

Keywords: X-ray free-electron lasers; XFELs; ptychography; ultra-short pulses; wavefronts.

Grants and funding

This work was funded by Vetenskapsrådet grant . Knut och Alice Wallenbergs Stiftelse grant . Stiftelsen för Strategisk Forskning grant . Swedish Foundation for International Cooperation in Research and Higher Education grant . Diamond Light Source grant . Seventh Framework Programme grants 279753 and 312284.