The dielectric breakdown of solid polymeric materials is due to the inception and propagation of electrical trees inside them. The remaining useful life of the solid dielectrics could be determined using propagation simulations correlated with non-intrusive measurements such as partial discharges (PD). This paper presents a brief review of the different models for simulating electrical tree propagation in solid dielectrics. A novel improved physical-stochastic model is proposed, which allows quantitatively and qualitatively analyzing the electrical tree propagation process in polymeric dielectrics. Simulation results exhibit good agreement with measurements presented in the literature. It is concluded that the model allows adequately predicting the tree propagation behavior and additional experimental analyses are required in order to improve the model accuracy.
Keywords: dielectric breakdown; electrical tree propagation; epoxy resin; insulation ageing; physical-stochastic models.