Analyzing contrast in cryo-transmission electron microscopy: Comparison of electrostatic Zach phase plates and hole-free phase plates

Ultramicroscopy. 2020 Nov:218:113086. doi: 10.1016/j.ultramic.2020.113086. Epub 2020 Jul 29.

Abstract

Phase plates (PPs) are beneficial devices to improve the phase contrast of life-science objects in cryo-transmission electron microscopy (TEM). The development of the hole-free (HF) PP, which consists of a thin carbon film, has led to impressive results due to its ease in fabrication, implementation and application. However, the phase shift of the HFPP can be controlled only indirectly. The electrostatic Zach PP uses a strongly localized and adjustable electrostatic potential to generate well-defined and variable phase shifts between scattered and unscattered electrons. However, artifacts in phase-contrast TEM images are induced by the presence of the PP rod in the diffraction plane. We present a detailed analysis and comparison of the contrast-enhancing capabilities of both PP types and their emerging artifacts. For this purpose, cryo-TEM images of a standard T4-bacteriophage test sample were acquired with both PP types. Simulated images reproduce the experimental images well and substantially contribute to the understanding of contrast formation. An electrostatic Zach PP was used in this work to acquire cryo-electron tomograms with enhanced contrast, which are of similar quality as tomograms obtained by HFPP TEM.

Keywords: Biological specimen; Cryo-electron tomography (cryo-ET); Cryo-transmission electron microscopy (TEM); Phase contrast; Phase plate; Thin film.

Publication types

  • Comparative Study
  • Research Support, N.I.H., Extramural
  • Research Support, Non-U.S. Gov't

MeSH terms

  • Artifacts
  • Bacteriophage T4 / ultrastructure*
  • Computer Simulation
  • Cryoelectron Microscopy / instrumentation*
  • Cryoelectron Microscopy / methods*
  • Electrons
  • Histocytological Preparation Techniques / methods
  • Microscopy, Electron, Transmission / instrumentation*
  • Microscopy, Electron, Transmission / methods*
  • Microscopy, Phase-Contrast / methods*