Coherent x-ray scattering in an XPEEM setup

T O Menteş; F Genuzio; V Schánilec; J Sadílek; N Rougemaille; A Locatelli

doi:10.1016/j.ultramic.2020.113035

Coherent x-ray scattering in an XPEEM setup

Ultramicroscopy. 2020 Sep:216:113035. doi: 10.1016/j.ultramic.2020.113035. Epub 2020 May 25.

Authors

T O Menteş¹, F Genuzio², V Schánilec³, J Sadílek⁴, N Rougemaille⁵, A Locatelli²

Affiliations

¹ Sincrotrone Trieste S.C.p.A., Basovizza-Trieste 34149, Italy. Electronic address: tevfik.mentes@elettra.eu.
² Sincrotrone Trieste S.C.p.A., Basovizza-Trieste 34149, Italy.
³ Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut NÉEL, Grenoble 38000, France; Central European Institute of Technology, CEITEC BUT, Brno University of Technology, Purkyňova 123, Brno 612 00, Czech Republic.
⁴ Central European Institute of Technology, CEITEC BUT, Brno University of Technology, Purkyňova 123, Brno 612 00, Czech Republic.
⁵ Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut NÉEL, Grenoble 38000, France.

PMID: 32544784
DOI: 10.1016/j.ultramic.2020.113035

Abstract

X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.

Keywords: CDI; LEEM; Reconstruction; Resonant x-ray scattering; Speckle; XPEEM.