Combining high temperature sample preparation and in-situ magnetic fields in XPEEM

Anna Mandziak; Juan de la Figuera; Jose Emilio Prieto; Jordi Prat; Michael Foerster; Lucía Aballe

doi:10.1016/j.ultramic.2020.113010

Combining high temperature sample preparation and in-situ magnetic fields in XPEEM

Ultramicroscopy. 2020 Jul:214:113010. doi: 10.1016/j.ultramic.2020.113010. Epub 2020 May 3.

Authors

Anna Mandziak¹, Juan de la Figuera², Jose Emilio Prieto², Jordi Prat³, Michael Foerster³, Lucía Aballe³

Affiliations

¹ Alba Synchrotron Light Facility, CELLS, Barcelona E-08290, Spain; Instituto de Química Física 'Rocasolano', Madrid E-28006, Spain. Electronic address: ania.mandziak@iqfr.csic.es.
² Instituto de Química Física 'Rocasolano', Madrid E-28006, Spain.
³ Alba Synchrotron Light Facility, CELLS, Barcelona E-08290, Spain.

PMID: 32408179
DOI: 10.1016/j.ultramic.2020.113010

Abstract

We present a custom-made sample holder system for use in Elmitec Low Energy and PhotoEmission Electron Microscopes. It consists of two different sample holder bodies: one with a filament for high temperature measurements (up to more than 1500 K) and the other with integrated electromagnets for the in-situ application of in-plane/out-of-plane small magnetic fields. The sample is placed on a platelet which can be transferred between the two holders. This opens up new possibilities for the preparation of samples at high temperatures and investigation of their behavior under applied magnetic fields without leaving the ultra high vacuum system.

Keywords: Growth; LEEM; Magnetic domains; PEEM; Sample holder.