Development of an x-ray detector by polycrystalline diamond and its application in Z-pinch x-ray detection

Y Yu; P Xu; H Y Zhou; C J Qiu

doi:10.1063/5.0006430

Development of an x-ray detector by polycrystalline diamond and its application in Z-pinch x-ray detection

Rev Sci Instrum. 2020 Apr 1;91(4):043308. doi: 10.1063/5.0006430.

Authors

Y Yu¹, P Xu², H Y Zhou¹, C J Qiu³

Affiliations

¹ School of Physics, University of Science and Technology of China, Jinzhai Road 96#, 230026 Hefei, China.
² School of Resources Environment and Safety Engineering, University of South China, Changsheng Road 28#, 421001 Hengyang, China.
³ School of Mechanical Engineering, University of South China, Changsheng Road 28#, 421001 Hengyang, China.

PMID: 32357736
DOI: 10.1063/5.0006430

Abstract

Large-grain-sized polycrystalline diamond films are fabricated by electron assisted chemical vapor deposition. A pure SP3 carbon bond in the cubic lattice structure is confirmed by Raman spectrum analysis. The grain size is on the order of several hundreds of μm or larger. Interlaced-finger electrodes are imprinted onto a 6 × 6 mm² × 500 µm film to fabricate the x-ray detector. The width of every finger is 25 µm, and the distance between nearby fingers is 25 μm. Strong x ray irradiates when a pulsed current flows through a double-layer nested tungsten wire array in the Z-pinch. This diamond detector now works as one of the main x-ray detectors for the Z-pinch device. The diamond detector is calibrated using a plastic scintillator. The comparison between the signal measured by these two methods confirms that the large-grain-sized polycrystalline diamond is a good candidate for the detection of nanosecond pulsed x ray.