In situ Measuring Film-Depth-Dependent Light Absorption Spectra for Organic Photovoltaics

Xiang Feng; Yuheng Wang; Tong Xiao; Zichao Shen; Yurong Ren; Guanghao Lu; Laju Bu

doi:10.3389/fchem.2020.00211

In situ Measuring Film-Depth-Dependent Light Absorption Spectra for Organic Photovoltaics

Front Chem. 2020 Apr 7:8:211. doi: 10.3389/fchem.2020.00211. eCollection 2020.

Authors

Xiang Feng^{1

2}, Yuheng Wang^{1

2}, Tong Xiao^{1

2}, Zichao Shen^{1

2}, Yurong Ren^{1

2}, Guanghao Lu^{1

2}, Laju Bu^{1

2}

Affiliations

¹ Frontier Institute of Science and Technology, and School of Science, Xi'an Jiaotong University, Xi'an, China.
² State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, China.

Abstract

Organic donor-acceptor bulk heterojunction are attracting wide interests for solar cell applications due to solution processability, mechanical flexibility, and low cost. The photovoltaic performance of such thin film is strongly dependent on vertical phase separation of each component. Although film-depth-dependent light absorption spectra measured by non-in situ methods have been used to investigate the film-depth profiling of organic semiconducting thin films, the in situ measurement is still not well-resolved. In this work, we propose an in situ measurement method in combination with a self-developed in situ instrument, which integrates a capacitive coupled plasma generator, a light source, and a spectrometer. This in situ method and instrument are easily accessible and easily equipped in laboratories of the organic electronics, which could be used to conveniently investigate the film-depth-dependent optical and electronic properties.

Keywords: bulk heterojunction; depth profiling; light absorption spectroscopy; organic photovoltaics; organic solar cells.