25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: feature introduction

Peter Kner; Suliana Manley; Yoav Shechtman; Sjoerd Stallinga

doi:10.1364/BOE.391490

25^th Anniversary of STED Microscopy and the 20^th Anniversary of SIM: feature introduction

Biomed Opt Express. 2020 Feb 28;11(3):1707-1711. doi: 10.1364/BOE.391490. eCollection 2020 Mar 1.

Authors

Peter Kner¹, Suliana Manley², Yoav Shechtman³, Sjoerd Stallinga⁴

Affiliations

¹ School of Electrical and Computer Engineering, University of Georgia, Athens, GA 30602, USA.
² Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), 1015 Lausanne, Switzerland.
³ Biomedical Engineering Department, Technion, 32000 Haifa, Israel.
⁴ Quantitative Imaging Group, Delft University of Technology, Delft, Netherlands.

Abstract

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.