Movable electrical probes were used to diagnose the beam flux profile and potential of ion beams since the early 1960s. Experimental measurements of beam plasmas can provide essential data related to the space charge neutralization, but the current-voltage characteristics obtained from such electrical probes are dominated by beam ion impact and ion-induced secondary emission. In this work, we present an analysis of the Langmuir characteristics obtained in a negative ion beam. We identify and discuss separately the contributions to the collected current given by secondary plasma ions and electrons, stripped electrons, beam ions, and ion-induced secondary electron emission. We present the beam plasma parameters obtained at different beam energies in NIO1.