Understanding heterogeneity in Genesis diamond-like carbon film using SIMS analysis of implants

Amy J G Jurewicz; Don S Burnett; Karen D Rieck; Richard Hervig; Tom A Friedmann; Peter Williams; Charles P Daghlian; Roger Wiens

doi:10.1007/s10853-017-1267-3

Understanding heterogeneity in Genesis diamond-like carbon film using SIMS analysis of implants

J Mater Sci. 2017;52(19):11282-11305. doi: 10.1007/s10853-017-1267-3. Epub 2017 Jul 5.

Authors

Amy J G Jurewicz¹, Don S Burnett², Karen D Rieck³, Richard Hervig⁴, Tom A Friedmann⁵, Peter Williams⁶, Charles P Daghlian⁷, Roger Wiens⁸

Affiliations

¹ 1Center for Meteorite Studies, School of Earth and Space Exploration, Arizona State University, PO. Box 876004, Tempe, AZ 85287-6004 USA.
² 2Department of Geology and Planetary Sciences, California Institute of Technology, m/c 100-10, Pasadena, CA 91125 USA.
³ 3ISR-2 (Space and Remote Sensing), Los Alamos National Laboratory, m/s D-434, Los Alamos, NM 87545 USA.
⁴ 4School of Earth and Space Exploration, Arizona State University, Tempe, AZ 85287 USA.
⁵ 5Department of Nanostructure and Semiconductor Physics, Sandia National Laboratories, Albuquerque, NM 87185-1415 USA.
⁶ 6School of Molecular Science, Arizona State University, Tempe, AZ 85287 USA.
⁷ 7Electron Microscope Facility, Geisel School of Medicine, Dartmouth College, Hanover, NH 03755 USA.
⁸ 8ISR-1 (Space Science and Applications), Los Alamos National Laboratory, m/s D-466, Los Alamos, NM 87545 USA.

Abstract

An amorphous diamond-like carbon film deposited on silicon made at Sandia National Laboratory by pulsed laser deposition was one of several solar wind (SW) collectors used by the Genesis Mission (NASA Discovery Class Mission #5). The film was ~1 μm thick, amorphous, anhydrous, and had a high ratio of sp ³-sp ² bonds (>50%). For 27 months of exposure to space at the first Lagrange point, the collectors were passively irradiated with SW (H fluence ~2 × 10¹⁶ ions cm^-2; He fluence ~8 × 10¹⁴ ions cm^-2). The radiation damage caused by the implanted H ions peaked at 12-14 nm below the surface of the film and that of He about 20-23 nm. To enable quantitative measurement of the SW fluences by secondary ion mass spectroscopy, minor isotopes of Mg (²⁵Mg and ²⁶Mg) were commercially implanted into flight-spare collectors at 75 keV and a fluence of 1 × 10¹⁴ ions cm^-2. The shapes of analytical depth profiles, the rate at which the profiles were sputtered by a given beam current, and the intensity of ion yields are used to characterize the structure of the material in small areas (~200 × 200 ± 50 μm). Data were consistent with the hypothesis that minor structural changes in the film were induced by SW exposure.