Estimation of systematic errors committed when approximating length of grain boundaries using edges of rectangular or hexagonal grids of EBSD maps

Piotr Bobrowski

doi:10.1016/j.micron.2019.102812

Estimation of systematic errors committed when approximating length of grain boundaries using edges of rectangular or hexagonal grids of EBSD maps

Micron. 2020 Mar:130:102812. doi: 10.1016/j.micron.2019.102812. Epub 2019 Dec 19.

Author

Piotr Bobrowski¹

Affiliation

¹ Institute of Metallurgy and Materials Science of Polish Academy of Sciences, 25 Reymonta Str., PL-30-059, Krakow, Poland. Electronic address: p.bobrowski@imim.pl.

PMID: 31874373
DOI: 10.1016/j.micron.2019.102812

Abstract

A method for calculating the overestimation error of grain boundary (GB) length committed when approximating a straight segment of a GB using edges of rectangular or hexagonal grid was given. The relative errors range from 0 % to 41.42 % and from 15.47 % to 33.33 %, for the square and hex grids, respectively. The average error values for both kinds of meshes are the same, namely, 27.32 %. Comparison of the mathematical calculations with experimental results obtained from Electron Backscatter Diffraction (EBSD) data, indicated that the values of the average overestimation errors may be utilized as correction coefficients to adjust experimental data towards more accurate numbers.

Keywords: Boundary density; Boundary length; EBSD; Experimental uncertainty; Grain boundary.

Publication types

Research Support, Non-U.S. Gov't