The dynamics of electronic transitions in solid-state materials are closely linked to microscopic morphology, but it is challenging to simultaneously characterize their spectral and temporal response with high spatial resolution. We present a time-resolved nonlinear microscopy system using white-light supercontinuum pulses as a broadband light source. This system is capable of correlating nanometer scale sample morphology determined from atomic force topography measurements with broadband transient absorption hyperspectral images and ultrafast 2D white-light spectra, all with a spatial resolution of ≤1 μm. The experimental apparatus is described with a focus on the dispersion management strategies necessary to minimize the duration of optical pulses when implementing an AOM based pulse-shaping system covering a broad-spectral range in the VIS/NIR. Experiments on TIPS-pentacene organic semiconductor microcrystals are used to demonstrate the unique capabilities of this technique.