In this work, we have demonstrated a stimulated emission (SE)-based pump-probe microscopy with subharmonic fast gate synchronization, which allows over an order of magnitude improvement in signal-to-noise ratio. Critically, the alternative way of modulation is implemented with the highest possible frequency that follows the lasers' repetition rate. Its working is based on a homemade frequency divider that divides the repetition frequency (76 MHz) of the Ti:sapphire (probe) laser to half of the repetition frequency, 38 MHz, which is used to synchronously drive the pump laser and to provide the reference signal for the ensuing lock-in detection. In this way, SE can be detected with sensitivity reaching the theoretical (shot noise) limits, with a much lower time constant (0.1 ms) for faster image acquisition.