Bit Error Rate Closed-Form Expressions for LoRa Systems under Nakagami and Rice Fading Channels

Claudio Ferreira Dias; Eduardo Rodrigues de Lima; Gustavo Fraidenraich

doi:10.3390/s19204412

Bit Error Rate Closed-Form Expressions for LoRa Systems under Nakagami and Rice Fading Channels

Sensors (Basel). 2019 Oct 12;19(20):4412. doi: 10.3390/s19204412.

Authors

Claudio Ferreira Dias¹, Eduardo Rodrigues de Lima², Gustavo Fraidenraich³

Affiliations

¹ Department of Digital Hardware Design, Instituto Eldorado, Eldorado, Alan Turing - 275, Campinas 13083-898, Brazil. aplnx@decom.fee.unicamp.br.
² Department of Digital Hardware Design, Instituto Eldorado, Eldorado, Alan Turing - 275, Campinas 13083-898, Brazil. eduardo.lima@eldorado.org.br.
³ Department of Communications, University of Campinas, Albert Einstein - 400, Campinas 13083-852, Brazil. gf@decom.fee.unicamp.br.

Abstract

We derive exact closed-form expressions for Long Range (LoRa) bit error probability and diversity order for channels subject to Nakagami-m, Rayleigh and Rician fading. Analytical expressions are compared with numerical results, showing the accuracy of our proposed exact expressions. In the limiting case of the Nakagami and Rice parameters, our bit error probability expressions specialize into the non-fading case.

Keywords: Internet of Things; LPWAN; MIMO; Nakagami; Rayleigh; Rice.

Abstract

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