We have developed an acceptance-cone-tunable (ACT) electron spectrometer for the highly efficient constant-energy photoelectron mapping of functional materials. The ACT spectrometer consists of the hemispherical deflection analyzer with the mesh-type electrostatic lens near the sample. The photoelectron trajectory can be converged by applying a negative bias to the sample and grounding the mesh lens and the analyzer entrance. The performance of the present ACT spectrometer with neither rotating nor tilting of the sample is demonstrated by the wide-angle observation of the well-known π-band dispersion of a single crystalline graphite over the Brillouin zone. The acceptance cone of the spectrometer is expanded by a factor of 3.30 when the negative bias voltage is 10 times as high as the kinetic energy of photoelectrons.