An electron beam position and angle monitoring system, ps-BPM, has been shown to be able to measure the electron source position and angle at a single location in a beamline at a synchrotron source. This system uses a monochromator to prepare a photon beam whose energy is at that of the K-edge of an absorber filter. The divergence of the beam from the source gives an energy range that will encompass the K-edge of the filter. A measurement of the centre of the monochromatic beam and the K-edge location through the absorber filter gives the position and angle of the electron source. Here, it is shown that this system is also capable of measuring the source size and divergence at the same time. This capability is validated by measurement as the beam size in the storage ring was changed and by ray-tracing simulations. The system operates by measuring the photon beam spatial distribution as well as a K-edge filtered beam distribution. These additional measurements result in the ability to also determine the electron source size and divergence.
Keywords: X-ray diffraction; beam emittance monitor; diagnostics and feedback; phase space.
open access.