Systems far from equilibrium respond to probes in a history-dependent manner. The prediction of the system response depends on either knowing the details of that history or being able to characterize all the current system properties. In crystal plasticity, various processing routes contribute to a history dependence that may manifest itself through complex microstructural deformation features with large strain gradients. However, the complete spatial strain correlations may provide further predictive information. In this paper, we demonstrate an explicit example where spatial strain correlations can be used in a statistical manner to infer and classify prior deformation history at various strain levels. The statistical inference is provided by machine-learning techniques. As source data, we consider uniaxially compressed crystalline thin films generated by two dimensional discrete dislocation plasticity simulations, after prior compression at various levels. Crystalline thin films at the nanoscale demonstrate yield-strength size effects with very noisy mechanical responses that produce a serious challenge to learning techniques. We discuss the influence of size effects and structural uncertainty to the ability of our approach to distinguish different plasticity regimes.