In this study, we analyze how the octahedral tilts and rotations of thin films of LaNiO3 and LaAlO3 grown on different substrates, determined using synchrotron X-ray diffraction-measured half-integer Bragg peaks, depend upon the total film thickness. We find a striking difference between films grown on SrTiO3 and LaAlO3 substrates which appears to stem not only from the difference in epitaxial strain state but also from the level of continuity at the heterointerface. In particular, the chemically and structurally discontinuous LaNiO3/SrTiO3 and LaAlO3/SrTiO3 interfaces cause a large variation in the octahedral network as a function of film thickness whereas the rather continuous LaNiO3/LaAlO3 interface seems to allow from just a few unit cells the formation of a stable octahedral pattern corresponding to that expected only given the applied biaxial strain.
Keywords: Perovskite; X-ray diffraction; heterostructure; nickelate; structure; thin film.