Recent advances in nanorobotic manipulation inside scanning electron microscopes

Microsyst Nanoeng. 2016 Jun 20:2:16024. doi: 10.1038/micronano.2016.24. eCollection 2016.

Abstract

A scanning electron microscope (SEM) provides real-time imaging with nanometer resolution and a large scanning area, which enables the development and integration of robotic nanomanipulation systems inside a vacuum chamber to realize simultaneous imaging and direct interactions with nanoscaled samples. Emerging techniques for nanorobotic manipulation during SEM imaging enable the characterization of nanomaterials and nanostructures and the prototyping/assembly of nanodevices. This paper presents a comprehensive survey of recent advances in nanorobotic manipulation, including the development of nanomanipulation platforms, tools, changeable toolboxes, sensing units, control strategies, electron beam-induced deposition approaches, automation techniques, and nanomanipulation-enabled applications and discoveries. The limitations of the existing technologies and prospects for new technologies are also discussed.

Keywords: SEM-based nanomanipulation; automated nanomanipulation; scanning electron microscope.

Publication types

  • Review