We introduce a nanopipette/quartz tuning fork (QTF)-atomic force microscope (AFM) for nanolithography and a nanorod/QTF-AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF-AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF-AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF-AFM with force sensor capability and high sensitivity.
Keywords: QTF–AFM; nanolithography; nanopipette; nanorod; nanoscratching.