The influence of optical excitation intensity on the electrical, ferroelectric and pyroelectric properties of ferroelectric-semiconductor-composites was investigated. For this purpose, composite thin films consisting of poly(vinylidene fluoride-co-trifluoroethylene) and 10 vol % (Cd:Zn)S particles with a thickness of 34 µm were fabricated. The samples were used to measure the absolute pyrocoefficient and to determine the relative pyroelectric depth profile using Laser Intensity Modulated Method. It was shown that a polarization of the samples without an optical excitation at the utilized relatively small peak-to-peak voltages could not be verified by the Sawyer⁻Tower circuit and the measurement setup of the pyroelectric coefficient, respectively. Both remanent polarization and pyroelectric coefficients increased with increasing optical excitation intensity during poling as well as increasing peak-to-peak voltage. The pyrocoefficient shows a temporal decay in the first hours after poling. The specific heat and thermal conductivity or the thermal diffusivity are required for the calibration of the pyroelectric depth profile. Rule of mixture and photo-acoustic investigations proved that the thermal properties of the utilized composites do not differ significantly from those of the pristine polymer. Based on the pyroelectric depth profile which is proportional to the polarization profile, the existing "three phase model" has been extended to generate a replacement circuit diagram, explaining the local polarization due to the optical excitation dependency for both local resistivity and local field strength.
Keywords: composite; ferroelectric polymer; optical excitation; semiconductor.