A variety of medical, industrial, and scientific applications requires highly sensitive and cost-effective x-ray detectors for photon energies ranging from keV to MeV. Adapting the thickness of polycrystalline or single crystal conversion layers especially to high-energy applications increases the complexity of fabrication and potentially decreases the performance of conventional direct conversion x-ray detectors. To tackle the challenges with respect to the active layer thickness and to combine the superior performance of single crystal materials with the low-cost nature of polycrystalline conversion layers, we investigate thin film x-ray detector technologies based on a folded device architecture. Analytical models simulating the sensitivity and the detective quantum efficiency (DQE) are used to evaluate the performance of folded detectors based on polycrystalline organic-inorganic perovskite semiconductors in various layout configurations and for different photon energies. Simulations of folded perovskite devices show high sensitivities. The DQE analysis introduces additional noise related boundary conditions for the folding length. A comparison with conventional detectors based on state of the art conversion materials at different photon energies demonstrates the potential of the folded detector layout as simulated sensitivities are comparable to single crystal detectors.