A Wolter imager on the Z machine to diagnose warm x-ray sources

J R Fein; D J Ampleford; J K Vogel; B Kozioziemski; C C Walton; M Wu; C R Ball; A Ames; J Ayers; P Bell; C J Bourdon; D Bradley; R Bruni; G S Dunham; P D Gard; D Johnson; K Kilaru; C Kirtley; P W Lake; A Maurer; L Nielsen-Weber; L A Pickworth; M J Pivovaroff; B Ramsey; O J Roberts; G A Rochau; S Romaine; M Sullivan

doi:10.1063/1.5038347

A Wolter imager on the Z machine to diagnose warm x-ray sources

Rev Sci Instrum. 2018 Oct;89(10):10G115. doi: 10.1063/1.5038347.

Authors

J R Fein¹, D J Ampleford¹, J K Vogel², B Kozioziemski², C C Walton², M Wu¹, C R Ball¹, A Ames³, J Ayers², P Bell², C J Bourdon¹, D Bradley², R Bruni³, G S Dunham¹, P D Gard¹, D Johnson¹, K Kilaru⁴, C Kirtley¹, P W Lake¹, A Maurer¹, L Nielsen-Weber¹, L A Pickworth², M J Pivovaroff², B Ramsey⁵, O J Roberts⁴, G A Rochau¹, S Romaine³, M Sullivan¹

Affiliations

¹ Sandia National Laboratories, 1515 Eubank Blvd SE, Albuquerque, New Mexico 87123, USA.
² Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94551, USA.
³ Smithsonian Astrophysical Observatory, 60 Garden Street, Cambridge, Massachusetts 02138, USA.
⁴ Universities Space Research Association, 320 Sparkman Drive, Huntsville, Alabama 35805, USA.
⁵ NASA-Marshall Spaceflight Center, Huntsville, Alabama 35811, USA.

PMID: 30399891
DOI: 10.1063/1.5038347

Abstract

A new Wolter x-ray imager has been developed for the Z machine to study the emission of warm (>15 keV) x-ray sources. A Wolter optic has been adapted from observational astronomy and medical imaging, which uses curved x-ray mirrors to form a 2D image of a source with 5 × 5 × 5 mm³ field-of-view and measured 60-300-μm resolution on-axis. The mirrors consist of a multilayer that create a narrow bandpass around the Mo Kα lines at 17.5 keV. We provide an overview of the instrument design and measured imaging performance. In addition, we present the first data from the instrument of a Mo wire array z-pinch on the Z machine, demonstrating improvements in spatial resolution and a 350-4100× increase in the signal over previous pinhole imaging techniques.