Au-doped MgO films were prepared by reactive sputtering of individual Mg and Au targets, and the Au doping effect on the electron-induced secondary electron emission (SEE) performance was explored by means of surface analysis, first-principle calculation, and electrical characteristic measurement. The results show that the size enlargement of MgO grains and the reduction of surface work functions induced by Au doping are the main reasons for the increase of the SEE coefficient (δ). Additionally, the superior SEE degradation property of the Au-doped MgO film under continuous electron bombardment results from the improvement of electrical conductivity. Through the optimization of Au doping concentration (x), Au-doped MgO film with an x value of 3.0% was found to have the best SEE performance due to its highest SEE coefficient and longest duration of maintaining a relatively high SEE coefficient; its maximum δ value reached 11.5-an increase of 32.2% in comparison with the undoped one.
Keywords: Au doping; Au-doped MgO films; electrical conductivity; first-principle calculation; secondary electron emission; work function.