We present the potential of an antireflection self-reference method based on ultra-thin tantalum nitride (TaN) nanofilms for improving terahertz (THz) reflection spectroscopy. The antireflection self-reference method is proposed to eliminate mutual interference caused by unwanted reflections, which significantly interferes with the important reflection from the actual sample in THz reflection measurement. The antireflection self-reference model was investigated using a wave-impedance matching approach, and the theoretical model was verified in experimental studies. We experimentally demonstrated this antireflection self-reference method can completely eliminate the effect of mutual interference, accurately recover the actual sample's reflection and improve THz reflection spectroscopy. Our method paves the way to implement a straightforward, accurate and efficient approach to investigate THz properties of the liquids and biological samples.