Control chart pattern recognition using RBF neural network with new training algorithm and practical features

ISA Trans. 2018 Aug:79:202-216. doi: 10.1016/j.isatra.2018.04.020. Epub 2018 May 4.

Abstract

The control chart patterns are the most commonly used statistical process control (SPC) tools to monitor process changes. When a control chart produces an out-of-control signal, this means that the process has been changed. In this study, a new method based on optimized radial basis function neural network (RBFNN) is proposed for control chart patterns (CCPs) recognition. The proposed method consists of four main modules: feature extraction, feature selection, classification and learning algorithm. In the feature extraction module, shape and statistical features are used. Recently, various shape and statistical features have been presented for the CCPs recognition. In the feature selection module, the association rules (AR) method has been employed to select the best set of the shape and statistical features. In the classifier section, RBFNN is used and finally, in RBFNN, learning algorithm has a high impact on the network performance. Therefore, a new learning algorithm based on the bees algorithm has been used in the learning module. Most studies have considered only six patterns: Normal, Cyclic, Increasing Trend, Decreasing Trend, Upward Shift and Downward Shift. Since three patterns namely Normal, Stratification, and Systematic are very similar to each other and distinguishing them is very difficult, in most studies Stratification and Systematic have not been considered. Regarding to the continuous monitoring and control over the production process and the exact type detection of the problem encountered during the production process, eight patterns have been investigated in this study. The proposed method is tested on a dataset containing 1600 samples (200 samples from each pattern) and the results showed that the proposed method has a very good performance.

Keywords: AR; CCP; RBFNN; Shape features; Statistic features.