On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

Sergey Y Luchkin; Keith J Stevenson

doi:10.1017/S1431927618000156

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

Microsc Microanal. 2018 Apr;24(2):126-131. doi: 10.1017/S1431927618000156. Epub 2018 Apr 5.

Authors

Sergey Y Luchkin¹, Keith J Stevenson¹

Affiliation

¹ Skolkovo Institute of Science and Technology,Nobel St. 3,Moscow 143026,Russian Federation.

PMID: 29618390
DOI: 10.1017/S1431927618000156

Abstract

In this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

Keywords: AFM; KPFM; electrostatic force; resolution; tip geometry.