Note: Force- and torque-detection of high frequency electron spin resonance using a membrane-type surface-stress sensor

Hideyuki Takahashi; Kento Ishimura; Tsubasa Okamoto; Eiji Ohmichi; Hitoshi Ohta

doi:10.1063/1.5018831

Note: Force- and torque-detection of high frequency electron spin resonance using a membrane-type surface-stress sensor

Rev Sci Instrum. 2018 Mar;89(3):036108. doi: 10.1063/1.5018831.

Authors

Hideyuki Takahashi¹, Kento Ishimura², Tsubasa Okamoto², Eiji Ohmichi², Hitoshi Ohta³

Affiliations

¹ Organization for Advanced and Integrated Research, Kobe University, 1-1, Rokkodai, Nada, Kobe 657-8501, Japan.
² Graduate School of Science, Kobe University, 1-1 Rokkodai-cho, Nada, Kobe 657-8501, Japan.
³ Molecular Photoscience Research Center, Kobe University, 1-1 Rokkodai-cho, Nada, Kobe 657-8501, Japan.

PMID: 29604792
DOI: 10.1063/1.5018831

Abstract

We developed a practical useful method for force- and torque-detected electron spin resonance (FDESR/TDESR) spectroscopy in the millimeter wave frequency region. This method uses a commercially available membrane-type surface-stress (MSS) sensor. The MSS is composed of a silicon membrane supported by four beams in which piezoresistive paths are integrated for detecting the deformation of the membrane. Although this device has a lower spin sensitivity than a microcantilever, it offers several distinct advantages, including mechanical strength, ease of use, and versatility. These advantages make this device suitable for practical applications that require FDESR/TDESR.