Wrinkled graphene oxide (WGO) is formed using the solution method. The sub-μm-sized wrinkles are generated on the GO surface, with more wrinkles forming as the GaCl3 in the solution increases. The wrinkles are observed using scanning electron microscopy (SEM) and atomic force microscopy (AFM) methods. The OH bonds connected to the GO surface are believed to cause the WGO, and these additional chemical bonds are detected via the Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy. As with the wrinkled graphene, the wrinkled GO provides a much larger surface area and can expedite the production of advanced sensor and energy charging devices.