Use of a broadband monitoring system for the determination of the optical constants of a dielectric bilayer

Séverin L Nadji; Michel Lequime; Thomas Begou; Cihan Koc; Catherine Grézes-Besset; Julien Lumeau

doi:10.1364/AO.57.000877

Use of a broadband monitoring system for the determination of the optical constants of a dielectric bilayer

Appl Opt. 2018 Feb 1;57(4):877-883. doi: 10.1364/AO.57.000877.

Authors

Séverin L Nadji, Michel Lequime, Thomas Begou, Cihan Koc, Catherine Grézes-Besset, Julien Lumeau

PMID: 29400759
DOI: 10.1364/AO.57.000877

Abstract

This paper extends a method previously applied to the determination of the optical constants of a high-index thin film to a dielectric bilayer. This method is based on the time recording of the spectral transmittance of the stack during its deposition with the help of an in situ broadband monitoring system.