Author Correction: Orientational Mapping Augmented Sub-Wavelength Hyper-Spectral Imaging of Silk

Sci Rep. 2018 Jan 24;8(1):1752. doi: 10.1038/s41598-018-19721-3.

Meguya Ryu¹, Armandas Balčytis^{2

3}, Xuewen Wang², Jitraporn Vongsvivut⁴, Yuta Hikima⁵, Jingliang Li⁶, Mark J Tobin⁴, Saulius Juodkazis^{7

8

9}, Junko Morikawa¹⁰

¹ Tokyo Institute of Technology, Meguro-ku, Tokyo, 152-8550, Japan.
² Nanotechnology facility, Center for Micro-Photonics, Swinburne University of Technology, John st., Hawthorn, Victoria, 3122, Australia.
³ Department of Laser Technologies, Center for Physical Sciences and Technology, Savanoriu Ave. 231, LT-02300, Vilnius, Lithuania.
⁴ Infrared Microspectroscopy Beamline, Australian Synchrotron, Clayton, Victoria, 3168, Australia.
⁵ Department of Chemical Engineering, Graduate School of Engineering, Kyoto University, Nishikyo-ku, Kyoto, 615-8510, Japan.
⁶ Institute for Frontier Materials, Deakin University, Waurn Ponds, Victoria, 3217, Australia.
⁷ Nanotechnology facility, Center for Micro-Photonics, Swinburne University of Technology, John st., Hawthorn, Victoria, 3122, Australia. sjuodkazis@swin.edu.au.
⁸ Center of Nanotechnology, King Abdulaziz University, Jeddah, 21589, Saudi Arabia. sjuodkazis@swin.edu.au.
⁹ Melbourne Center for Nanofabrication, Australian National Fabrication Facility, Clayton, 3168, Australia. sjuodkazis@swin.edu.au.
¹⁰ Tokyo Institute of Technology, Meguro-ku, Tokyo, 152-8550, Japan. morikawa.j.aa@m.titech.ac.jp.

Abstract

A correction to this article has been published and is linked from the HTML version of this paper. The error has been fixed in the paper.