In Situ
SEM Nanomanipulation and Nanomechanical/Electrical Characterization
Scanning
.
2017 Nov 5:2017:8016571.
doi: 10.1155/2017/8016571.
eCollection 2017.
Authors
Yang Lu
1
,
Yajing Shen
1
,
Xinyu Liu
2
,
Mohd Ridzuan Bin Ahmad
3
,
Yan Chen
4
Affiliations
1
City University of Hong Kong, Kowloon, Hong Kong.
2
University of Toronto, Toronto, ON, Canada.
3
Universiti Teknologi Malaysia, Johor, Malaysia.
4
Arizona State University, Mesa, AZ, USA.
PMID:
29238439
PMCID:
PMC5697378
DOI:
10.1155/2017/8016571
No abstract available
Publication types
Editorial