Erratum to: Infrared Reflectance Analysis of Epitaxial n-Type Doped GaN Layers Grown on Sapphire
Nanoscale Res Lett
.
2017 Aug 21;12(1):502.
doi: 10.1186/s11671-017-2227-1.
Authors
Bogdan I Tsykaniuk
1
,
Andrii S Nikolenko
2
,
Viktor V Strelchuk
2
,
Viktor M Naseka
2
,
Yuriy I Mazur
3
,
Morgan E Ware
3
,
Eric A DeCuir Jr
3
,
Bogdan Sadovyi
4
,
Jan L Weyher
4
,
Rafal Jakiela
5
,
Gregory J Salamo
3
,
Alexander E Belyaev
2
Affiliations
1
V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, Kiev, 03680, Ukraine. btsykaniuk@gmail.com.
2
V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, Kiev, 03680, Ukraine.
3
Institute for Nanoscience and Engineering, University of Arkansas, West Dickson 731, Fayetteville, AR, 72701, USA.
4
Institute of High Pressure Physics, Polish Academy of Sciences, Sokolowska str. 29/37, 01-142, Warsaw, Poland.
5
Institute of Physics, Polish Academy of Sciences, Al. Lotnikow 32/46, PL-02-668, Warsaw, Poland.
PMID:
28828578
PMCID:
PMC5565748
DOI:
10.1186/s11671-017-2227-1
No abstract available
Publication types
Published Erratum