One-shot profile inspection for surfaces with depth, color and reflectivity discontinuities

Opt Express. 2017 May 1;25(9):9999-10015. doi: 10.1364/OE.25.009999.

Abstract

A one-shot technique for surfaces with depth, color, and reflectivity discontinuities is presented. It uses windowed Fourier transform to extract the fringe phases and a binary-encoded scheme to unwrap the phases. Experiments show that absolute phases could be obtained with high reliability.