Development toward high-resolution X-ray phase imaging

Atsushi Momose

doi:10.1093/jmicro/dfx013

Development toward high-resolution X-ray phase imaging

Microscopy (Oxf). 2017 Jun 1;66(3):155-166. doi: 10.1093/jmicro/dfx013.

Author

Atsushi Momose^{1

2

3}

Affiliations

¹ Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan.
² JST-ERATO Momose Quantum-beam Phase Imaging Project, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan.
³ JASRI/SPring-8, 1-1-1 Kouto, Sayo-cho, Hyogo 679-5198, Japan.

PMID: 28430991
DOI: 10.1093/jmicro/dfx013

Abstract

Since the 1990s, the use of X-ray phase contrast has been extensively studied for imaging weakly absorbing objects consisting of low-Z elements such as biological soft tissues and polymers. The development of X-ray microscopy was also progressing during this time, although absorption contrast was only available. It was straightforward and important to develop phase-contrast X-ray microscopy. One characteristic in the development is that quantitative phase measurement is possible through the acquisition of phase-contrast images under a specific procedure, thanks to digital X-ray image detectors. Therefore, such a technique is called 'phase imaging' rather than phase-contrast imaging in this review. Highly sensitive three-dimensional phase imaging is feasible in combination with tomography. This article reviews the progress in X-ray phase imaging, especially with regards to X-ray microscopy.

Keywords: X-ray microscopy; interferometry; phase contrast; phase imaging; tomography.