Advanced electron holography techniques for in situ observation of solid-state lithium ion conductors

Tsukasa Hirayama; Yuka Aizawa; Kazuo Yamamoto; Takeshi Sato; Hidekazu Murata; Ryuji Yoshida; Craig A J Fisher; Takehisa Kato; Yasutoshi Iriyama

doi:10.1016/j.ultramic.2017.03.012

Advanced electron holography techniques for in situ observation of solid-state lithium ion conductors

Ultramicroscopy. 2017 May:176:86-92. doi: 10.1016/j.ultramic.2017.03.012. Epub 2017 Mar 15.

Authors

Tsukasa Hirayama¹, Yuka Aizawa², Kazuo Yamamoto², Takeshi Sato², Hidekazu Murata³, Ryuji Yoshida², Craig A J Fisher², Takehisa Kato⁴, Yasutoshi Iriyama⁴

Affiliations

¹ Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, Aichi 456-8587, Japan. Electronic address: t-hirayama@jfcc.or.jp.
² Nanostructures Research Laboratory, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, Aichi 456-8587, Japan.
³ Faculty of Science and Technology, Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya, Aichi 468-8502, Japan.
⁴ Department of Materials, Physics and Energy Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, Aichi 464-8601, Japan.

PMID: 28341556
DOI: 10.1016/j.ultramic.2017.03.012

Abstract

Advanced techniques for overcoming problems encountered during in situ electron holography experiments in which a voltage is applied to an ionic conductor are reported. The three major problems encountered were 1) electric-field leakage from the specimen and its effect on phase images, 2) high electron conductivity of damage layers formed by the focused ion beam method, and 3) chemical reaction of the specimen with air. The first problem was overcome by comparing experimental phase distributions with simulated images in which three-dimensional leakage fields were taken into account, the second by removing the damage layers using a low-energy narrow Ar ion beam, and the third by developing an air-tight biasing specimen holder.

Keywords: 3D-boundary-charge method; Chemical stability in air; Electric-field leakage; Electron holography; Focused ion beam damage layers; Lithium ion conductor.

Publication types

Research Support, Non-U.S. Gov't