Substantial synthetic vanadium pentoxide (V₂O₅) nanowires were successfully produced by a vapor-solid (VS) method of thermal evaporation without using precursors as nucleation sites for single crystalline V₂O₅ nanowires with a (110) growth plane. The micromorphology and microstructure of V₂O₅ nanowires were analyzed by scanning electron microscope (SEM), energy-dispersive X-ray spectroscope (EDS), transmission electron microscope (TEM) and X-ray diffraction (XRD). The spiral growth mechanism of V₂O₅ nanowires in the VS process is proved by a TEM image. The photo-luminescence (PL) spectrum of V₂O₅ nanowires shows intrinsic (410 nm and 560 nm) and defect-related (710 nm) emissions, which are ascribable to the bound of inter-band transitions (V 3d conduction band to O 2p valence band). The electrical resistivity could be evaluated as 64.62 Ω·cm via four-point probe method. The potential differences between oxidation peak and reduction peak are 0.861 V and 0.470 V for the first and 10th cycle, respectively.
Keywords: PL spectrum; V2O5 nanowires; VS method; cyclic voltammetric curve; electrical resistivity; four-point probe method; screw dislocation; spiral growth mechanism.