In this paper, we propose a new procedure which aims at measuring the polarisation switching current at the nanoscale on ferroelectric thin films with the atomic force microscope tip used as a top electrode. Our technique is an adaptation of the so-called positive up negative down method commonly operated on large electrodes. The main obstacle that must be overcome to implement such measurement is the enhancement of the signal to noise ratio, in a context where the stray capacitance of the sample/tip/lever/lever holder system generates a dielectric displacement current several orders of magnitude higher than the current to be measured. This problem is solved by the subtraction of the displacement current through a reference capacitance. For the first time, we show an example of nanoscale positive up negative down measurement of the polarisation charge on a PbZrTiO3 thin film and compare the measured value with paraelectric samples. From the comparison with macroscopic measurement, we deduce the effective area of contact between the tip and the sample.